Showing results: 1726 - 1740 of 4500 items found.
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KATC-V2 -
The Eastern Specialty Company
Knopp’s KATC-V2 is a highly accurate state-of-the-art voltage transformer comparator that is compatible with all older generation Knopp comparators, and is designed to be a direct, plug-in replacement with additional test set cables to fit in the existing Knopp Voltage Transformer Test Systems.
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ScanExpress DFT Analyzer -
Corelis, Inc.
Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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SCR ELEKTRONIKS
SCR ELEKTRONIKS focuses on designing a solution around the end use at her customer. Instead of offering a standard instrument for a specific task, we have an approach of customizing the test bench to target the specific goals of the process or test procedure. Our measurement instruments, test modules, electrical power systems & software libraries are developed with this vision, thereby reducing the test system’s time-to-deploy. Cord Grip Test Apparatus for testing effectiveness of the retention in flexible cables.
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781887-01 -
NI
Connects measurement and signal generation devices. Model options include industry-standard coaxial connector types including BNC, SMA, SMB, and MCX. Long cables can act as antennae picking up extra noise that can affect measurements, so ensure you select only the length required for your test system. Also look at the impedance of your test system and consider buying a cable with the same impedance. Matched impedance can maximize the power transfer or minimize signal reflection from the load of your system.
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Sanwood Environmental Chambers Co ., Ltd.
Sanwood , a 23 years of Bench-top Xenon Lamp Test Chamber, Bench-top Xenon lamp aging test chamber, Bench-top xenon lamp weathering test chamber ,Xenon Lamp Test Chamber, Xenon Test Chamber manufacturers Small, simple and economic xenon test chamber. It uses a low power air-cooling xenon lamp to produce enough big irradiance energy in a small space. Moreover, through a special catoptrical system to ensure every exposure sample get the homogeneous irradiance distribution.
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PITC -
Bemco Inc.
The PITC, with a temperature range of -70 C to +177 C, was first introduced in the late 1950s by Bemcos Conrad/Missimer Division. Today, the modernized version of this system is the ideal solution where short run or infrequent tests are required, test specimens are unusual in size or shape, initial capital costs must be held low, or test needs are frequently changed.
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40-682A-002 -
Pickering Interfaces Ltd.
The 40-682A-002 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 250mA current and 40V voltage handling. The 40-682A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
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40-681A-001 -
Pickering Interfaces Ltd.
The 40-681A-001 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 350mA current and 60V voltage handling. The 40-681A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
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40-683A-001 -
Pickering Interfaces Ltd.
The 40-683A-001 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 125mA current and 100V voltage handling. The 40-683A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
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7751TG2-HD -
Evertz Microsystems Ltd.
The 7751TG2-HD Test Signal Generator provides a cost-effective method of generating 1.5Gb/s HDTV 4:2:2 and 4:4:4 test signals. The 7751TG2-HD is ideal for checking signal path integrity, or to determine system performance over varying cable lengths. The 7751TG2-HD generates test signals in a wide variety of SMPTE 292M video formats.
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Polaris Networks
The LTE PGW Functional Tester provides a wrap-around test solution for the Packet Date Network Gateway by emulating all the LTE network elements surrounding the PDN-GW (System Under Test). The P-GW Functional Tester emulates LTE Core Network entities such as the S-GW, PCRF, OCS and OFCS. It tests the S5/S8, S7/Gx, Gy and Gz interfaces of the P-GW.
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Flynn Systems Corp.
Whether plugging into a test executive, or running as a plug-in to your own interface, onTAP’s DLL can be linked to and run from third party test executives such as, National Instruments’ LabVIEW™. Flynn Systems provides GUI demo programs written in C++ and C# showing you how to link the onTAP DLL to your test executive
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GPIB -
Test Electronics
Test Electronics will customize the TE3000 GPIB signal routing box for your test application. Then, you simply rack and stack all the equipment, cable all the switched signals to the back of this GPIB box, add a rack mount computer, plug in the National Instruments GPIB board and software. Then run your customized GPIB based test system.
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NX Solo -
Dynalab Test Systems, Inc.
The Dynalab NX Solo Wire HarnessTester is a low-cost, feature-packed, stand-alone tester with a maximum capacity of 256 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to decide which operation to perform next. Testing for continuity, shorts, and a variety of components.
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Di-Series™ -
Teradyne, Inc.
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).